
Trace-level EDXRF
NEX CG II Series
Indirect excitation, secondary targets and 3D Cartesian geometry deliver excellent signal-to-noise performance for demanding multi-element analysis.

RIGAKU EDXRF ANALYZERS
Select the sensitivity, speed, automation and operating model that match your elements, matrices and daily workload.
PRODUCT RANGE

Trace-level EDXRF
Indirect excitation, secondary targets and 3D Cartesian geometry deliver excellent signal-to-noise performance for demanding multi-element analysis.

High-throughput EDXRF
A high-powered 60 kV tube and high-performance silicon drift detector support fast measurements and demanding quality-control workflows.

Routine quality control
A compact benchtop analyzer with embedded computer, intuitive touchscreen and built-in printer for accessible routine elemental testing.
AT A GLANCE
| Platform | Primary strength | Excitation | Best suited to |
|---|---|---|---|
| NEX CG II Series | Trace-level EDXRF | 50–100 W · 3D Cartesian | Environmental and geological screening |
| NEX DE Series | High-throughput EDXRF | 60 kV · Direct excitation | Industrial process and incoming-material control |
| NEX QC II Series | Routine quality control | 50 kV · Routine QC | Cement, minerals and construction materials |
SELECTION METHOD
Target elements, concentration ranges, matrices and required detection limits determine the appropriate excitation architecture.
Sample volume, preparation time, operator experience and reporting needs establish the throughput and automation level.
The analyzer, accessories, preparation equipment, standards, calibration, training and service plan are specified together.
START A PROJECT
Send us your application requirements and sample information for a focused configuration review.